SWIR camera with ultra-high resolution realized by CIS's patented piezo-actuator-based pixel shift technology. Capable of inspecting invisible part of objects with detection wavelength spectrum from 400~1700nm. On top of that, applying pixel-shifting technology to the 1.3M SWIR sensor, camera achieves max. 21M pixels. Complies with CoaXPress Ver. 1.1.1. and supports CXP-3 x1 lane. Suitable for various inspection applications such as wafer inspection, PCB inspection, food and agricultural products inspection, tablet inspection, and more.

Learn More

Request More Information

By clicking above, I acknowledge and agree to Endeavor Business Media’s Terms of Service and to Endeavor Business Media's use of my contact information to communicate with me about offerings by Endeavor, its brands, affiliates and/or third-party partners, consistent with Endeavor's Privacy Policy. In addition, I understand that my personal information will be shared with any sponsor(s) of the resource, so they can contact me directly about their products or services. Please refer to the privacy policies of such sponsor(s) for more details on how your information will be used by them. You may unsubscribe at any time.